Resistance at the edge: imperfect conductance quantization in 2D topological insulators

Posted in Journal Articles on April 26, 2013 at 6:45 am by JCCMP

1. Helical edge resistance introduced by charge puddles.
Authors: Jukka I. Vayrynen, Moshe Goldstein and Leonid I. Glazman.
arXiv:1303.1766

Recommended with a commentary by Jason Alicea, Caltech
|View Commentary (PDF)|

DOI: 10.36471/JCCM_April_2013_01
https://doi.org/10.36471/JCCM_April_2013_01

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