Observation of Electron-Hole Puddles in Graphene Using a Scanning Single Electron Transistor
Authors: J. Martin, N. Akerman, G. Ulbricht, T. Lohmann, J. H. Smet, K. von Klitzing, and A. Yacoby
http://arxiv.org/abs/0705.2180
Recommended with a Commentary by Francisco Guinea, Instituto de Ciencia de Materiales de Madrid | View Commentary (pdf) |
JCCM_July07_02
This manuscript has already been published
in Physical Review Letters:
Phys. Rev. Lett. 99, 015301 (2007)
(cf prl.aps.org)
Regards,
Yonko Millev