Increasing Redundancy Exponentially Reduces Error Rates during Algorithmic Self-Assembly

Posted in Journal Articles on September 29, 2015 at 12:01 pm by JCCMP

Increasing Redundancy Exponentially Reduces Error Rates during Algorithmic Self-Assembly.
Authors:Rebecca Schulman, Christina Wright, and Erik Winfree.
ACS Nano 9,5760(2015)

Recommended with a commentary by Randall D.Kamien, University of Pennsylvania.
|View Commentary|

DOI: 10.36471/JCCM_September_2015_02
https://doi.org/10.36471/JCCM_September_2015_02

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