Observation of Electron-Hole Puddles in Graphene Using a Scanning Single Electron Transistor
Authors: J. Martin, N. Akerman, G. Ulbricht, T. Lohmann, J. H. Smet, K. von Klitzing, and A. Yacoby http://arxiv.org/abs/0705.2180 Recommended with a Commentary by Francisco Guinea, Instituto de Ciencia de Materiales de Madrid | View Commentary (pdf) | JCCM_July07_02