A Holographic View Inside a MOS Capacitor

Posted in Journal Articles on November 30, 2022 at 4:25 pm by JCCMP

Extended Charge Layers in Metal-Oxide-Semiconductor Nanocapacitors Revealed by Operando Electron Holography
Authors: C. Gatel, R. Serra, K. Gruel, A. Masseboeuf, L. Chapuis, R. Cours, L. Zhang, B. Warot-Fonrose, and M. J. Hÿtch
Physical Review Letters 129, 137701 (2022); DOI: 10.1103/PhysRevLett.129.137701

Recommended with a commentary by Joe Checkelsky, Massachusetts Institute of Technology
|View Commentary (pdf)|

This commentary may be cited as:
DOI: 10.36471/JCCM_November_2022_01
https://doi.org/10.36471/JCCM_November_2022_01

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