A Holographic View Inside a MOS Capacitor
Extended Charge Layers in Metal-Oxide-Semiconductor Nanocapacitors Revealed by Operando Electron Holography Authors: C. Gatel, R. Serra, K. Gruel, A. Masseboeuf, L. Chapuis, R. Cours, L. Zhang, B. Warot-Fonrose, and M. J. Hÿtch Physical Review Letters 129, 137701 (2022); DOI: 10.1103/PhysRevLett.129.137701 Recommended with a commentary by Joe Checkelsky, Massachusetts Institute of Technology |View Commentary (pdf)| This […]